Author: Delsim-Hashemi, H.
Paper Title Page
MOPG75 Single Shot Transversal Profile Monitoring of Ultra Low Charge Relativistic Electron Bunches at REGAE 257
  • H. Delsim-Hashemi
    DESY, Hamburg, Germany
  Relativistic electron microscopes are increasingly under consideration in dream experiments of observing atomic scale motions as they occur. Compared to ordinary electron microscopes with energies limited to few tens of keV, relativistic electrons reduce strongly the space-charge effects. This enables packing more electrons in shorter bunches and thereby capturing atomic scale ultra-fast dynamics in single shot. A typical relativistic-electron-microscope, based on an RF-gun, can provide experiments with couple of thousands to millions of electrons bunched in a few μm length and a transversal dimension of a fraction of a mm. After scattering from a sample and at the position of detector, electrons are distributed over transversal dimensions typically two orders of magnitude larger. For transversal diagnostics before scattering a cost effective solution is implemented while for diffraction pattern detection objective is single-electron imaging with good signal to noise ratio in single shot. In this contribution the implementations and results at REGAE will be presented.  
DOI • reference for this paper ※ DOI:10.18429/JACoW-IBIC2016-MOPG75  
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