Author: Bruker, M.W.
Paper Title Page
WEPG67 Non-Invasive Beam Profile Measurement for High Intensity Electron Beams 803
  • T. Weilbach, K. Aulenbacher, M.W. Bruker
    HIM, Mainz, Germany
  • K. Aulenbacher
    IKP, Mainz, Germany
  Beam profile measurements of high intensity electron beams below 10 MeV, e.g. in energy recovery linacs or magnetized high energy electron coolers, have to fulfill special demands. Commonly used diagnostic tools like synchrotron radiation and scintillation screens are ineffective or not able to withstand the beam power without being damaged. Non-invasive methods with comparable resolution are needed. Hence, a beam profile measurement system based on beam-induced fluorescence (BIF) was built. This quite simple system images the light generated by the interaction of the beam with the residual gas onto a PMT. A more elaborated system, the Thomson Laser Scanner (TLS) - the non-relativistic version of the Laser Wire Scanner - is proposed as a method for non-invasive measurement of all phase space components, especially in the injector and merger parts of an ERL. Since this measurement suffers from low count rates, special attention has to be given to the background. Beam profile measurements with the BIF system will be presented as well as a comparison with YAG screen measurements. The recent status of the TLS system will be presented.  
DOI • reference for this paper ※ DOI:10.18429/JACoW-IBIC2016-WEPG67  
Export • reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)